P, Prasann and M., Patel (1987) SEM studies on silica from plain materials, X-ray spectometro. X-Ray Spectrometry. pp. 57-60.
Full text not available from this repository. (Request a copy)Abstract
The Silica structural framework in plant materials can be separated from the organic part by acid leaching and can be examined by SEM. Scanning electron micrographs characterizing the bonding and distribution patterns of silica in rice husk, rice straw and sugarcane leaves are presented. The differences in the surface morphology of the three plant products are discussed.
| Item Type: | Article |
|---|---|
| Subjects: | Lightweight Materials |
| Divisions: | UNSPECIFIED |
| Depositing User: | Mr. B.K. Prasad |
| Date Deposited: | 13 Aug 2013 10:43 |
| Last Modified: | 13 Aug 2013 10:43 |
| URI: | http://ampri.csircentral.net/id/eprint/334 |
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